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1 article(s) from von Schmidsfeld, Alexander

Understanding interferometry for micro-cantilever displacement detection

Alexander von Schmidsfeld,
Tobias Nörenberg,
Matthias Temmen and
Michael Reichling

Beilstein J. Nanotechnol. 2016, 7, 841–851, doi:10.3762/bjnano.7.76

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Figure 1: Details of the NC-AFM measuring head in a front and side view showing the interferometric setup wit...

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Figure 2: Schematic representation of the interferometer setup, signal path and cavity parameters. Signal pow...

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Figure 3: Schematic representation of three common types of misalignment of fiber and cantilever; (a) lateral...

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Figure 4: Schematic representation of the interferometer signal P_sig as a function of the fiber–cantilever di...

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Figure 5: Signal power over distance measurements for three differently positioned cantilevers. Cantilever 1 ...

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Figure 6: Lateral interference patterns for cantilever 4 scanned by the fiber-positioning piezo for (a) Fabry...

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Figure 7: Interference patterns for cantilever 4 generated from the 3D intensity map data for (a,d) Fabry–Pér...

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Figure 8: Interferometer signal power P_sig of the main maximum (black) and a side maximum (gray) measured for...

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Figure 9: Displacement spectral density [Graphic 27] of the noise floor of the interferometer signal as a function of the...

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Full Research Paper

Published 10 Jun 2016

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